英语翻译The film thicknesses of the single layers were measured
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英语翻译
The film thicknesses of the single layers were measured with a
surface profiler.XRD (using 40 mA,40 kV CuK α radiation) mea-surement with an out-of-plane arrangement was carried out
using symmetric (θ–θ) and asymmetric (2θ) scan modes to
evaluate the crystal structure.The incident angle of the X-rays
was set to 1° with respect to film surface under the asymmetric
scan mode.XRD with an in-plane arrangement was performed
using the symmetric (θχ –2θχ) scan mode to detect X-rays
diffracted from crystal lattice planes perpendicular to the sub-strate surface plane,where the incident angle of the X-rays was
also 1° with respect to the film surface.The surface morphology of
the thin films was observed as a topography using atomic force
microscopy (AFM) in a dynamic scan mode,where the surface
roughness (Ra) was determined from the topographies.
不要用翻译软件,直接不对啊..
The film thicknesses of the single layers were measured with a
surface profiler.XRD (using 40 mA,40 kV CuK α radiation) mea-surement with an out-of-plane arrangement was carried out
using symmetric (θ–θ) and asymmetric (2θ) scan modes to
evaluate the crystal structure.The incident angle of the X-rays
was set to 1° with respect to film surface under the asymmetric
scan mode.XRD with an in-plane arrangement was performed
using the symmetric (θχ –2θχ) scan mode to detect X-rays
diffracted from crystal lattice planes perpendicular to the sub-strate surface plane,where the incident angle of the X-rays was
also 1° with respect to the film surface.The surface morphology of
the thin films was observed as a topography using atomic force
microscopy (AFM) in a dynamic scan mode,where the surface
roughness (Ra) was determined from the topographies.
不要用翻译软件,直接不对啊..
单身层的电影厚度一起测量一
升至水面 profiler .XRD(使用 40个妈,40个仟伏 CuK α放射线) mea-确信与一出自--飞机安排被实行了
使用对称的 (θ-θ)和不对称 (2 θ)扫描模态到
评估水晶的结构.X光的附带角度
被设定成 1° 与在不对称之下拍摄表面的尊敬
扫描模态.XRD 与一在-飞机安排被运行了
使用对称的 (θχ-2 θχ)者扫描模态发现 X光
使分散对子 strate 平面从水晶的格子将垂直线刨平,哪里 X光的附带角度是
也 1° 有关于电影表面.表面形态学
瘦的电影被当做一个地志使用原子的力量观察了
在一个动态的扫描模态中的显微镜使用 (AFM),哪里表面
粗糙 (Ra)从地志被决定.
升至水面 profiler .XRD(使用 40个妈,40个仟伏 CuK α放射线) mea-确信与一出自--飞机安排被实行了
使用对称的 (θ-θ)和不对称 (2 θ)扫描模态到
评估水晶的结构.X光的附带角度
被设定成 1° 与在不对称之下拍摄表面的尊敬
扫描模态.XRD 与一在-飞机安排被运行了
使用对称的 (θχ-2 θχ)者扫描模态发现 X光
使分散对子 strate 平面从水晶的格子将垂直线刨平,哪里 X光的附带角度是
也 1° 有关于电影表面.表面形态学
瘦的电影被当做一个地志使用原子的力量观察了
在一个动态的扫描模态中的显微镜使用 (AFM),哪里表面
粗糙 (Ra)从地志被决定.
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